Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure With the EM ACE600 sputter coater, users ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
insights from industryMatt Nowell & Michael Hassel ShearerProduct Manager Product ManagerEDAX Gatan In this interview, Matt Nowell, the EBSD product manager at EDAX, and Michael Hassel Shearer, ...
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